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View up-to-date information on Camtek Ltd patents, including inventor and filing insights.
Patent Trends
| Publication Identifier | Document Type | Title | Classification-CPC | Publication Date |
|---|---|---|---|---|
| US11828713B1 | Grant | Semiconductor inspection tool system and method for wafer edge inspection | G01N2021/8825; G01N2021/8841; G01N21/8806; G01N21/9503; H01L22/12 | November 28, 2023 |
| US20230280282A1 | Application | Continuous bump measurement height metrology | G01B11/06; G01B11/0608; G01B11/0625; G01B11/0633; G01B11/0675; G01B2210/50; G01B2210/56; G01N21/9501; G01N21/956 | September 07, 2023 |
| US20230251198A1 | Application | Dark field illumination based on laser illuminated phosphor | F21K9/64; F21Y2105/10; F21Y2115/30; G01N2021/6484; G01N2021/8816; G01N2021/8822; G01N2021/8825; G01N2021/8838; G01N21/255; G01N21/645; G01N21/8806; G01N21/9501; G01N2201/06193; G02B19/0057; G02B21/084; G02B21/10; G02B27/48 | August 10, 2023 |
| US20230228559A1 | Application | Bump measurement height metrology | G01B11/06; G01B11/0608; G01B11/0625; G01B11/0633; G01B11/0675; G01B2210/50; G01B2210/56; G01N21/9501; G01N21/956 | July 20, 2023 |
| KR1020230092924A | Application | 레이저 조명된 형광체에 기반한 암시야 조명 | F21K9/64; F21Y2105/10; F21Y2115/30; G01N2021/6484; G01N2021/8816; G01N2021/8822; G01N2021/8825; G01N2021/8838; G01N21/255; G01N21/645; G01N21/8806; G01N21/9501; G01N2201/06193; G02B19/0057; G02B21/084; G02B21/10; G02B27/48 | June 26, 2023 |
Top Inventors by Filings (Count by publication)
| Name | Count |
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