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Aehr Test Systems: Patents

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View up-to-date information on Aehr Test Systems patents, including inventor and filing insights.

Patent Trends

Publication Identifier Document Type Title Classification-CPC Publication Date
EP3589965B1 Grant Elektroniktester G01R1/0416; G01R1/0458; G01R1/0466; G01R1/0491; G01R31/2808; G01R31/2817; G01R31/2865; G01R31/2867; G01R31/2874; G01R31/2875; G01R31/2889; G01R31/2893; G01R31/2894; G01R31/2896; H01L21/687; H01L21/68757; H05K7/1402; H05K7/1412; H05K7/1417 December 06, 2023
US11835575B2 Grant Electronics tester G01R31/2889 December 05, 2023
US11821940B2 Grant Electronics tester G01R31/2808; G01R31/2893; H01L21/687; H05K7/1402; H05K7/1412; H05K7/1417 November 21, 2023
JP2023545764A Application 電子試験器 G01R31/2865; G01R31/2889; G01R31/2891; G01R31/2893; G01R31/2896 October 31, 2023
JP2023157947A Application 熱チャック内の二重螺旋熱制御通路を有するエレクトロニックテスター G01R1/0491; G01R31/2856; G01R31/2863; G01R31/2865; G01R31/2875; G01R31/2879; G01R31/2889 October 26, 2023
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