Jenoptik AG - Company Profile
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View up-to-date information on Jenoptik AG patents, including inventor and filing insights.
Patent Trends
| Publication Identifier | Document Type | Title | Classification-CPC | Publication Date |
|---|---|---|---|---|
| WO2022184513A1 | Application | VORRICHTUNG UND VERFAHREN ZUM MESSEN VON ABBILDUNGSEIGENSCHAFTEN EINES OPTISCHEN SYSTEMS | G01M11/0292 | September 09, 2022 |
| DE102021105027A1 | Application | Vorrichtung und Verfahren zum Messen von Abbildungseigenschaften eines optischen Systems | G01M11/0292 | September 08, 2022 |
| EP4049048A1 | Application | WAFER-LEVEL-TESTVERFAHREN FÜR OPTO-ELEKTRONISCHE CHIPS | G01R31/2891; G01R31/311 | August 31, 2022 |
| DE102020131069B4 | Grant | Verfahren und Vorrichtung zum Erzeugen einer Schwächungslinie in einer Oberfläche eines Bauteils; Computerprogrammprodukt sowie maschinenlesbares Speichermedium | B23K2101/006; B23K2103/34; B23K2103/38; B23K2103/42; B23K26/0006; B23K26/03; B23K26/0622; B23K26/082; B23K26/359; B23K26/364; B23K26/402 | August 25, 2022 |
| US11422242B2 | Grant | Method and evaluation unit for determining a time of a flank in a signal | G01S17/58; G01S7/4865; H03K5/1534; H03M9/00 | August 23, 2022 |
Top Inventors by Filings (Count by publication)
| Name | Count |
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